Model calculations for the analysis of scattering data from layered structures
- 1 November 1994
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 101 (9) , 7211-7220
- https://doi.org/10.1063/1.468278
Abstract
Model calculations for the interpretation of scattering patterns from layered structures are presented. They assume a rigid configuration of the layers which are then stacked in a deterministic or stochastic manner. Results for stacking faults of close‐packed crystals and for sheared sliding layers are presented. The method can easily be applied to other stacking sequences.Keywords
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