Structured Trace Diagnosis for LSSD Board Testing -- An Alternative to Full Fault Simulated Diagnosis

1 January 1981

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 891-897
https://doi.org/10.1109/dac.1981.1585459

Abstract

This paper reviews the structured design concept and conventional diagnostic methods. It presents an alternate approach, called structured-trace method, for diagnosing failures on high level packages, which are structurally designed, such as LSSD structure. Implications of structured designs on failure diagnosis are discussed. Results from an evaluation study of the method are presented.

Keywords

This publication has 4 references indexed in Scilit:

Testing Logic Networks and Designing for Testability
Computer, 1979
A Test Methodology for Large Logic Networks
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1978
Fault Masking in Combinational Logic Circuits
IEEE Transactions on Computers, 1975
Diagnosis of Short-Circuit Faults in Combinational Circuits
IEEE Transactions on Computers, 1974