A New Technique for Calibrating Dual Six-Port Networks with Application to S Parameter Measurements
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
This paper describes a new technique for the simultaneous calibration of two six-port networks as reflectometers. Once calibrated, the complete S parameters of an unknown two-port network can be obtained from power measurements alone. The technique requires only a uniform transmission line, of unknown length and loss, and a short circuit as calibrating standards. Its application to an automated microwave measurement system is described and potential error sources are quantitatively discussed.Keywords
This publication has 3 references indexed in Scilit:
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- A Network Analyzer Incorporating Two Six-Port ReflectometersIEEE Transactions on Microwave Theory and Techniques, 1977
- Using an Arbitrary Six-Port Junction to Measure Complex Voltage RatiosIEEE Transactions on Microwave Theory and Techniques, 1975