Direct evidence for boron segregation to grain boundaries in a nickel-base alloy by secondary ion mass spectrometry
- 1 January 1975
- journal article
- Published by Springer Nature in Metallurgical Transactions A
- Vol. 6 (1) , 226-229
- https://doi.org/10.1007/bf02673697
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Secondary ion emission for surface and in-depth analysis of tantalum thin filmsAnalytical Chemistry, 1973
- The distribution of boron in austeniteMetallurgical Transactions, 1972
- In situ identification of the silicide phase in super-α titanium alloysMetallurgical Transactions, 1972