Elastic and inelastic scattering effects in reflection electron microscopy
- 2 May 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 29 (1-4) , 175-182
- https://doi.org/10.1016/0304-3991(89)90244-1
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
- Reflection electron microscopyJournal of Applied Crystallography, 1987
- Dynamical diffraction calculations for RHEED and REMActa Crystallographica Section A Foundations of Crystallography, 1986
- Convergent-beam reflection high-energy electron diffraction (RHEED) observations from an Si(111) surfaceActa Crystallographica Section A Foundations of Crystallography, 1986
- Electron energy loss spectriscopy in glancing reflection from bulk crystalsUltramicroscopy, 1983
- Reflection electron microscopy (REM) of fcc metalsUltramicroscopy, 1983
- Surface reactions and excitationsUltramicroscopy, 1983
- Electron excitation and the optical potential in electron microscopyPhilosophical Magazine, 1977
- The climb motion of a propagating crack in a brittle crystalline solidPhysica Status Solidi (a), 1974
- Resonance effects in low and high energy electron diffraction by crystalsActa Crystallographica Section A, 1970
- Absorption parameters in electron diffraction theoryPhilosophical Magazine, 1968