Measurement of the Small Signal Parameters of Transistors

1 August 1953

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE

Vol. 41 (8) , 983-989
https://doi.org/10.1109/JRPROC.1953.274287

Abstract

A theoretical study of various small signal parameters of transistors shows that the set of parameters which is most appropriate for the description of the circuit operation of junction transistors differs from the set which is customarily measured for point contact transistors. A uniform method for measuring both sets of parameters is described in detail and the sources of error inherent in this method are discussed.

Keywords

ELECTRON TUBES
COLORED NOISE
VOLTAGE
NOISE FIGURE
PHASE NOISE
CIRCUIT NOISE
EQUIVALENT CIRCUITS
TRANSCONDUCTANCE
LINEAR CIRCUITS
CIRCUIT ANALYSIS

This publication has 2 references indexed in Scilit:

Some Circuit Properties and Applications of n-p-n Transistors
Proceedings of the IRE, 1951
Some Circuit Aspects of the Transistor
Bell System Technical Journal, 1949