An i n s i t u fracture stage for x-ray photoelectron spectroscopy and Auger electron spectroscopy studies of internal surfaces in polycrystalline materials

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Abstract
An in situ fracture state for x-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy studies of internal surfaces in polycrystalline materials is described. The system offers the possibility to study both surfaces produced as a result of a fracture, allowing the comparison of physical and compositional features of one surface with those of its conjugate. The notched sample can be cooled to liquid-nitrogen temperature prior to fraction. By using an electron collimator only photoelectrons from the fractured surface but not from the notch area are observed. The method is illustrated by XPS measurements obtained from fractured surfaces of an AlMgSiPb alloy (transgranular fracture), a Bi-doped ZnO varistor (intergranular fracture), and polypropylene containing an antioxidant (interspherulitic fracture). The main motivation which led to the development of this fracture stage lies in the possibility to correlate the microstructure and microchemistry of internal surfaces with the relevant macroscopic properties of polycrystalline materials.

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