Extended fine structure analysis of surfaces

This publication has 19 references indexed in Scilit:

• Effect of the central atom potential on the extended fine structure above appearance potential thresholds
  Physical Review B, 1980
• Extended-x-ray-absorption-fine-structure studies of low-$Z$ atoms in solids and on surfaces: Studies of ${\mathrm{Si}}_3$${\mathrm{N}}_4$, Si${\mathrm{O}}_2$, and oxygen on Si(111)
  Physical Review B, 1979
• Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)
  Physical Review Letters, 1978
• Extended-x-ray-absorption-fine-structure study of theBr2-graphite system
  Physical Review B, 1978
• Elastic and inelastic contributions to secondary electron yield structure
  Journal of Vacuum Science and Technology, 1978
• New method for the calculation of atomic phase shifts: Application to extended x-ray absorption fine structure (EXAFS) in molecules and crystals
  Physical Review B, 1977
• Extended x-ray-absorption fine structure—Auger process for surface structure analysis: Theoretical considerations of a proposed experiment
  Proceedings of the National Academy of Sciences, 1976
• Possibility of adsorbate position determination using final-state interference effects
  Physical Review B, 1976
• Extended x-ray-absorption fine-structure technique. III. Determination of physical parameters
  Physical Review B, 1975
• Low-energy electron diffraction from imperfect structures
  Surface Science, 1970