Diffraction-Induced Stray Light in Infrared Microspectroscopy and its Effect on Spatial Resolution

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Abstract
Model experiments were conducted in an effort to quantitatively assess the extent of stray light, resulting from diffraction, in an FT-IR microscope system. The effects of stray light were studied under conditions employing different aperturing modes, aperture sizes, and wavelengths of light. Results and consequences of the findings are discussed with respect to the spatial resolution and quantitative integrity of the data obtainable in mapping analyses of multilayer polymer laminates.

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