Surface Roughness Measurement by Two Wavelength Holographic Interferometry
- 1 May 1974
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 13 (5) , 1085-1088
- https://doi.org/10.1364/ao.13.001085
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Surface Roughness Measurement by Holographic InterferometryApplied Optics, 1972
- Multiple-Index Holographic ContouringApplied Optics, 1969
- Multiple-Wavelength and Multiple-Source Holography Applied to Contour Generation*Journal of the Optical Society of America, 1967