In situXPS analysis of various iron oxide films grown by-assisted molecular-beam epitaxy
- 15 January 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (4) , 3195-3202
- https://doi.org/10.1103/physrevb.59.3195
Abstract
We report on a systematic analysis of x-ray photoelectron spectroscopy (XPS) core- and valence-level spectra of clean and well-characterized iron oxide films, i.e., and All iron oxide films were prepared epitaxially by -assisted molecular-beam epitaxy on single crystalline MgO(100) and substrates. The phase and stoichiometry of the films were controlled precisely by adjusting the pressure during growth. The XPS spectrum of each oxide clearly showed satellite structures. These satellite structures were simulated using a cluster-model calculation, which could well reproduce the observed structures by considering the systematic changes in both the Fe to O hybridization and the electron-correlation energy. The small difference in the satellite structures between and resulted mainly from changes in the Fe-O hybridization parameters, suggesting an increased covalency in compared to With increasing reduction in the system, the satellite structures in XPS became unresolved. This was not only due to the formation of ions, but also to nonhomogeneous changes in the hybridization parameters between octahedral and tetrahedral ions.
Keywords
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