Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy
- 6 December 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 83 (23) , 4780-4783
- https://doi.org/10.1103/physrevlett.83.4780
Abstract
We introduce a new method which allows the precise determination of the tip-sample interaction potentials with an atomic force microscope and avoids the so-called “jump to contact” of the tip to the sample surface. The method is based on the measurement of the resonance frequency as a function of the resonance amplitude of the oscillated cantilever. The application of this method to model potentials and to experimental data, obtained for a graphite sample and a silicon tip in ultrahigh vacuum, demonstrates its reliability.Keywords
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