A new method of determining the atom form factor by high-voltage electron diffraction. An application of the effect of vanishing of the second-order reflexion
- 1 September 1968
- journal article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
- Vol. 24 (5) , 580-581
- https://doi.org/10.1107/s0567739468001245