Three-dimensional vision based on a combination of gray-code and phase-shift light projection: analysis and compensation of the systematic errors
- 1 November 1999
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 38 (31) , 6565-6573
- https://doi.org/10.1364/ao.38.006565
Abstract
A combination of phase-shift with gray-code light projection into a three-dimensional vision system based on the projection of structured light is presented. The gray-code method is exploited to detect without ambiguity even marked surface discontinuities, whereas the phase-shift technique allows the measurement of fine surface details. The system shows excellent linearity. An overall mean value of the measurement error equal to 40 µm, with a variability of approximately ±35 µm, corresponding to 0.06% of full scale, has been estimated. The implementation of the technique is discussed, the analysis of the systematic errors is presented in detail, and the calibration procedure designed to determine the optimal setting of the measurement parameters is illustrated.Keywords
This publication has 8 references indexed in Scilit:
- A three-dimensional imaging system for industrial applications with improved flexibility and robustnessJournal of Optics A: Pure and Applied Optics, 1999
- Three-dimensional imaging based on Gray-code light projection: characterization of the measuring algorithm and development of a measuring system for industrial applicationsApplied Optics, 1997
- Wavelength scanning profilometry for real-time surface shape measurementApplied Optics, 1997
- Linearly coded profilometryApplied Optics, 1997
- Time-of-flight analysis of light pulses with a temporal resolution of 100 psReview of Scientific Instruments, 1996
- Multicamera vision-based approach to flexible feature measurement for inspection and reverse engineeringOptical Engineering, 1993
- Laser range finder based on synchronized scannersApplied Optics, 1984
- A Perspective on Range Finding Techniques for Computer VisionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983