Low-resistance Ohmic conduction across compound semiconductor wafer-bonded interfaces

• 2 October 1995
• journal article
• Published by AIP Publishing in Applied Physics Letters
• Vol. 67  (14) , 2060-2062
• https://doi.org/10.1063/1.115078

Abstract

Keywords

• ELECTRIC CONDUCTIVITY
• GALLIUM ARSENIDE
• OHMIC CONTACT