Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 406-410
- https://doi.org/10.1016/s0169-4332(98)00563-7
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology
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