Electro-Absorption Effects at the Band Edges of Silicon and Germanium
- 13 May 1966
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 145 (2) , 575-583
- https://doi.org/10.1103/physrev.145.575
Abstract
The change in the absorption coefficient due to the presence of an electric field has been measured for the indirect-absorption edges of silicon and germanium and for the direct-absorption edge in germanium. The results show good qualitative agreement with the theoretical predictions. The quantitative deviations are caused by the presence of excitons and thermal and electric-field broadening, which have not been taken into account in the theory. The energies of the phonons which take part in indirect optical absorption have been determined from the room-temperature data and are in very good agreement with the values found at liquid-helium temperatures by other means.
Keywords
This publication has 30 references indexed in Scilit:
- Optical Field Effect in SiliconPhysical Review B, 1965
- Non-Reggeization of the Vector MesonPhysical Review B, 1965
- Dependence of the Optical Constants of Silicon on Uniaxial StressPhysical Review Letters, 1965
- Franz-Keldysh Effect of the Refractive Index in SemiconductorsPhysical Review B, 1965
- Field Effect of the Reflectivity in GermaniumJournal of Applied Physics, 1965
- High-Sensitivity PiezoreflectivityPhysical Review Letters, 1965
- Franz-Keldysh Effect in the Space-Charge Region of a GermaniumJunctionPhysical Review B, 1965
- Direct Observation of Phonons in Silicon by Electric-Field-Modulated Optical AbsorptionPhysical Review Letters, 1965
- Franz-Keldysh Effect above the Fundamental Edge in GermaniumPhysical Review Letters, 1965
- Electroabsorption Spectrum in SiliconPhysical Review Letters, 1964