Spatially Resolved EELS Fine Structures at a SiO₂/TiO₂ Interface

• 1 January 1996
• journal article
• Published by EDP Sciences in Microscopy Microanalysis Microstructures
• Vol. 7  (3) , 161-174
• https://doi.org/10.1051/mmm:1996112

Abstract

Keywords

• CHEMICAL INTERDIFFUSION
• ELECTRON ENERGY LOSS SPECTRA
• INTERFACE STRUCTURE
• SCANNING TRANSMISSION ELECTRON MICROSCOPY
• SILICON COMPOUNDS
• SURFACE DIFFUSION
• TITANIUM COMPOUNDS
• SPATIALLY RESOLVED EELS FINE STRUCTURES
• SIO SUB 2 TIO SUB 2 INTERFACE
• MULTILAYERS STACKS
• OPTICAL COATINGS
• LINE SPECTRUM MODE
• INCIDENT ELECTRON PROBE
• STEM
• INTERDIFFUSION
• SIO SUB 2 TIO SUB 2