Influence of ion bombardment on depth resolution in Auger electron spectroscopy analysis of thin gold films on nickel

This publication has 15 references indexed in Scilit:

• Quantitative auger electron spectroscopy analysis of AgPd and NiPd alloys
  Surface Science, 1975
• ISS imaging and depth−profile analysis using beam rastering and signal gating
  Journal of Vacuum Science and Technology, 1975
• Attenuation lengths of low-energy electrons in solids
  Surface Science, 1974
• Scanning Electron Microscopic Observation of Metal Surfaces Eroded by Argon Ions
  Japanese Journal of Applied Physics, 1974
• Ion beam sputtering - the effect of incident ion energy on atomic mixing in subsurface layers
  Radiation Effects, 1974
• Selected area and in-depth auger analysis of thin films
  Thin Solid Films, 1973
• Techniques for elemental composition profiling in thin films
  C R C Critical Reviews in Solid State Sciences, 1973
• Quantitative auger analysis of copper-nickel alloy surfaces after argon ion bombardment
  Surface Science, 1973
• Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solids
  Radiation Effects, 1973
• Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemission
  The European Physical Journal A, 1970