Comment on ‘‘A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect’’ [J. Appl. Phys. 72, 3363 (1992)]
- 15 July 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (2) , 1462
- https://doi.org/10.1063/1.354863
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effectJournal of Applied Physics, 1992
- Depletion-Layer Photoeffects in SemiconductorsPhysical Review B, 1959