Quantitative X-ray fluorescence analysis of boron in thin films of borophosphosilicate glasses
- 29 February 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 157 (2) , 325-336
- https://doi.org/10.1016/0040-6090(88)90013-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Wavelength Dispersing Devices for Soft and Ultrasoft X-Ray SpectrometersPublished by Springer Nature ,1985
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982
- X-ray and far uv multilayer mirrors: principles and possibilitiesApplied Optics, 1977
- On the deviation from the Bragg law and the widths of diffraction patterns in perfect crystalsPhilosophical Magazine, 1975
- Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis.Japanese Journal of Applied Physics, 1966
- Le rendement de fluorescenceJournal de Physique et le Radium, 1955