Temperature dependence of dislocation efficiency as sinks for self-interstitials in silicon as measured by gold diffusion
- 1 August 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 78 (3) , 1495-1499
- https://doi.org/10.1063/1.360239
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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