Effects of the working conditions of retarding field spectrometers on the energy distribution of secondary electrons
- 31 December 1977
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 12 (4) , 451-458
- https://doi.org/10.1016/0368-2048(77)85096-2
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Secondary electron and backscattering measurements for polycrystalline copper with a spherical retarding-field analyserJournal of Physics D: Applied Physics, 1973
- Role of Bulk and Surface Plasmons in the Emission of Slow Secondary Electrons: Polycrystalline AluminumPhysical Review B, 1973
- False peaks in the energy distribution of secondary electrons measured with a spherical retarding field analyserJournal of Physics D: Applied Physics, 1973
- Plasmon effects in electron energy loss and gain spectra in aluminiumSurface Science, 1972
- Refinements to a Standard LEED-Auger System for the Analysis of Electron Emission at Low Primary Beam EnergiesReview of Scientific Instruments, 1972
- Auger and other characteristic energies in secondary electron spectra from Al surfacesSurface Science, 1971
- Instrumental Effects of the Retarding Grids in a LEED ApparatusReview of Scientific Instruments, 1969
- Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED OpticsReview of Scientific Instruments, 1969
- Secondary Emission Studies on Ge and Na-Covered GeJournal of Applied Physics, 1967