Secondary Electron Ejection from Contaminated Metal Surface by He and Ar Atoms

• 1 October 1974
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 13  (10) , 1554-1561
• https://doi.org/10.1143/jjap.13.1554

Abstract

Keywords

• SECONDARY ELECTRON
• GROUND STATE
• YIELD STRENGTH
• CHARGE TRANSFER
• ION BEAM