Time-of-flight measurement of carrier transport and carrier collection in strained Si1−xGex/Si quantum wells
- 1 March 1994
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 12 (2) , 1156-1159
- https://doi.org/10.1116/1.587072