Rapid Testing for Noise Immunity of Electron Devices

1 April 1976

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability

Vol. R-25 (1) , 52-53
https://doi.org/10.1109/tr.1976.5214960

Abstract

Current switching in power control devices sometimes has serious noise difficulties. This paper presents a method of testing and measuring noise immunity. The noise immunity of a thyristor with magnetic core or unijunction transistor is analyzed and measured. The experiment agrees well with the theory.

Keywords

ELECTRON DEVICES
CIRCUIT NOISE
MAGNETIC NOISE
THYRISTORS
CIRCUIT TESTING
MAGNETIC CIRCUITS
IMMUNITY TESTING
MAGNETIC CORES
LIFE ESTIMATION
GAUSSIAN NOISE

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