Transistor Reliability Studies
- 1 February 1954
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 42 (2) , 414-419
- https://doi.org/10.1109/jrproc.1954.274679
Abstract
Factors affecting the useful life of transistors are discussed. From consideration of their structure, long life might well be expected, and has been shown to occur for usual laboratory conditions. However, under high humidity or high temperature, life is sometimes greatly shortened. Mechanisms of the effects are described. Corrective measures are under way.Keywords
This publication has 1 reference indexed in Scilit:
- -Type Surface Conductivity on-Type GermaniumPhysical Review B, 1953