Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data
- 1 June 1994
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 27 (3) , 338-344
- https://doi.org/10.1107/s0021889893010441
Abstract
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