Spectroellipsometric characterization of plasma-deposited Au/SiO2 nanocomposite films
- 1 January 2000
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 87 (1) , 228-235
- https://doi.org/10.1063/1.371849
Abstract
No abstract availableThis publication has 57 references indexed in Scilit:
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