The dependence of electron channeling line width degradation on deformation mode
- 30 November 1986
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 20 (11) , 1597-1600
- https://doi.org/10.1016/0036-9748(86)90402-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Dislocation distributions associated with fatigue cracking on cleavage planesMaterials Science and Engineering, 1986
- Electron channeling patterns in the scanning electron microscopeJournal of Applied Physics, 1982
- The effect of deformation on selected area electron channelling patternsJournal of Materials Science Letters, 1982
- Kikuchi-like reflection patterns obtained with the scanning electron microscopePhilosophical Magazine, 1967