A Field Instrument For Surface Roughness Measurement
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 1177-1180
- https://doi.org/10.1109/igarss.1989.576035
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Profile Meters for Detailed Measurement of Soil Surface HeightsApplied Engineering in Agriculture, 1987