Spectroscopic ellipsometry and thermoreflectance of GaAs
- 1 September 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 78 (5) , 3380-3386
- https://doi.org/10.1063/1.359966
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
- Optical Properties of (AlxGa1-x)0.5In0.5P Quaternary AlloysJapanese Journal of Applied Physics, 1994
- Optical Properties of PbTeJapanese Journal of Applied Physics, 1994
- Optical Constants of Cubic ZnSJapanese Journal of Applied Physics, 1993
- Optical properties of CdTe: Experiment and modelingJournal of Applied Physics, 1993
- Optical Constants of In1-xGaxSb Ternary Alloys: Experiment and ModelingJapanese Journal of Applied Physics, 1993
- Optical Constants of Zn1-xCdxTe Ternary Alloys: Experiment and ModelingJapanese Journal of Applied Physics, 1993
- Optical properties of ZnTeJournal of Applied Physics, 1993
- Optical properties of ZnSePhysical Review B, 1991
- Interband critical points of GaAs and their temperature dependencePhysical Review B, 1987
- Direct Verification of the Third-Derivative Nature of Electroreflectance SpectraPhysical Review Letters, 1972