Weak-Beam Electron Microscopy

• 1 August 1981
• journal article
• Published by Annual Reviews in Annual Review of Materials Science
• Vol. 11  (1) , 75-95
• https://doi.org/10.1146/annurev.ms.11.080181.000451

Abstract

Keywords

• GRAIN BOUNDARY
• ELECTRON MICROSCOPY
• STACKING FAULT ENERGY
• HIGH RESOLUTION
• ELECTRON SCATTERING
• DISLOCATIONS