Cumulative Damage Processes and Alertness of the Worker
- 1 October 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-25 (4) , 281-283
- https://doi.org/10.1109/TR.1976.5219997
Abstract
A device which is exposed to the cumulative damage process due to the occurrence of shocks is considered. The life distribution of the device is obtained here. Damages occur to the device when the worker is not alert or the device is weak. Known results in counter theory are used to obtain results.Keywords
This publication has 4 references indexed in Scilit:
- Shock models with underlying birth processJournal of Applied Probability, 1975
- Shock Models and Wear ProcessesThe Annals of Probability, 1973
- On a Probability Problem in the Theory of CountersThe Annals of Mathematical Statistics, 1958
- On the Sequence of Events, Selected by a Counter From a Recurrent Process of EventsTheory of Probability and Its Applications, 1956