Rietveld Refinement using Synchrotron X-ray Powder Diffraction Data Collected in Transmission Geometry using an Imaging-Plate Detector: Application to Standardm-ZrO2
- 1 December 1996
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 29 (6) , 707-713
- https://doi.org/10.1107/s0021889896008199
Abstract
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