Voltage dependence of off current in a-Si:H TFT under backlight illumination
- 1 December 1993
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 164-166, 747-750
- https://doi.org/10.1016/0022-3093(93)91105-c
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Study of the Vth shift of the thin-film transistor by the bias temperature stress testIBM Journal of Research and Development, 1992