Apparatus used in the development of optical-diffraction methods for the solution of problems in X-ray analysis
- 1 April 1953
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 30 (4) , 105-110
- https://doi.org/10.1088/0950-7671/30/4/301
Abstract
The methods described involve the observation of the diffraction patterns of holes punched in thin card to represent atomic arrangements. Details are given of the instrument that is used to observe these patterns and also of the pantograph-punch that is used to prepare the cards. Several examples of diffraction patterns are given; some illustrate the performance of the instrument with lenses of various optical qualities and others illustrate the use of the instrument in the teaching of physical optics.Keywords
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