Computational analysis of the surface permittivity and charging of dielectrics with the SEM-mirror technique
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. 27 (6) , 1127-1135
- https://doi.org/10.1109/14.204863
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Pulsed voltage pre-breakdown observations on silicon in vacuumPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A SEM technique for investigating the insulating properties of dielectric surfacesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Flashover in wide-band-gap high-purity insulators: Methodology and mechanismsJournal of Applied Physics, 1991
- Charging phenomena on insulating materials: Mechanisms and applicationsScanning, 1990
- Influence of mechanical grinding and polishing operations of brittle polycrystalline alumina on the pulsed surface flashover performanceJournal of Applied Physics, 1990
- A review of the charge simulation method and its applicationsIEEE Transactions on Electrical Insulation, 1989
- Surface flashover of insulatorsIEEE Transactions on Electrical Insulation, 1989
- dc surface flashover mechanism along solids in vacuum based on a collision-ionization modelJournal of Applied Physics, 1988
- Monte Carlo Simulation and Analysis of Elastic and Inelastic Scattering of Electrons in InsulatorsIEEE Transactions on Nuclear Science, 1987
- Prebreakdown Processes Associated with Surface Flashover of Solid Insulators in VacuumIEEE Transactions on Electrical Insulation, 1977