Quantitative depth distribution of dislocations by planar channeling
- 1 October 1978
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 68 (2) , 244-246
- https://doi.org/10.1016/0375-9601(78)90817-4
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Channeling analysis of stacking defects in epitaxial Si layersNuclear Instruments and Methods, 1978
- Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92, E(4He) = 400–4000 keVAtomic Data and Nuclear Data Tables, 1974
- Dechanneling by stacking faults and dislocationsRadiation Effects, 1972
- Defect studies in crystals by means of channelingCanadian Journal of Physics, 1968