Effect of Stress on the Low-Temperature Phase Transformation in V3Si
- 1 August 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (9) , 3447-3449
- https://doi.org/10.1063/1.1708879
Abstract
The influence of stress on the low‐temperature structural transformation in V3Si was investigated. A large stress can completely suppress the transformation as observed by x‐ray Berg‐Barrett and lattice parameter measurements. A lower stress can affect the morphology and extent of the transformation but leaves the transformation temperature Tm unchanged.This publication has 7 references indexed in Scilit:
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- Crystal Structure of SuperconductingSiPhysical Review Letters, 1964
- Criterion for the action of applied stress in the martensitic transformationActa Metallurgica, 1953