An experimental determination of the carrier lifetime in p-i-n diodes from the stored carrier charge
- 31 October 1964
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 7 (10) , 717-724
- https://doi.org/10.1016/0038-1101(64)90028-0
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Die Abh ngigkeit der Stromdichte einesp-i-n-Gleichrichters von der Breite seiner MittelzoneThe European Physical Journal A, 1955