Grain growth in a texture, studied by means of electron-emission microscopy
- 28 February 1951
- Vol. 17 (2) , 117-IN5
- https://doi.org/10.1016/0031-8914(51)90024-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Dislocation Models of Crystal Grain BoundariesPhysical Review B, 1950
- The Orientation Dependence of the Rate of Grain Boundary MigrationJournal of Applied Physics, 1950
- Strain Induced Grain Boundary Migration in High Purity AluminumJournal of Applied Physics, 1950
- Über die (111)-reflexe im gewalzten und rekristallisierten nickeleisenPhysica, 1941
- Recrystallization in rolled nickel-ironPhysica, 1941