Interpretation of atomic force microscopy images: The mica (001) surface with a diamond tip apex
- 1 May 1994
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 12 (3) , 2179-2183
- https://doi.org/10.1116/1.587736
Abstract
Constant‐force atomic force microscopy (AFM) images of the muscovite mica surface are calculated and compared to experimental ones. The surface structure is first optimized using a molecular mechanic procedure. Force–distance characteristics are proposed to determine the applied force range where the surface is not deformed. Calculated rigid substrate and tip apex AFM images are interpreted and compared with the experimental ones. A full relaxed calculated scan is presented and compared to rigid calculated scans.Keywords
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