Application of principal component analysis to detect outliers and spectral deviations in near-field surface-enhanced Raman spectra
- 1 November 2001
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 446 (1-2) , 71-83
- https://doi.org/10.1016/s0003-2670(01)01267-3
Abstract
No abstract availableKeywords
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