Angular distribution measurements of electrons emitted from thin film Au–SiOx–Au diode and triode structures
- 16 June 1977
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 41 (2) , 439-442
- https://doi.org/10.1002/pssa.2210410212
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- The angular distribution of electrons emitted from thin-film MIM structures at various temperaturesPhysica Status Solidi (a), 1971
- A model for filament growth and switching in amorphous oxide filmsJournal of Non-Crystalline Solids, 1970
- The influence of dielectric properties on the emission of a metal-dielectric-metal system: Angular distribution of emitted electronsCzechoslovak Journal of Physics, 1968