Polarization-induced trapped charge in ferroelectrics
- 14 April 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 70 (15) , 2010-2012
- https://doi.org/10.1063/1.118805
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Driving force behind voltage shifts in ferroelectric materialsApplied Physics Letters, 1996
- Voltage offsets in (Pb,La)(Zr,Ti)O3 thin filmsApplied Physics Letters, 1995
- Photoinduced hysteresis changes and optical storage in (Pb,La)(Zr,Ti)O3 thin films and ceramicsJournal of Applied Physics, 1994
- Electronic domain pinning in Pb(Zr,Ti)O3 thin films and its role in fatigueApplied Physics Letters, 1994
- Correlations Among Degradations in Lead Zirconate Titanate thin Film CapacitorsMRS Proceedings, 1993
- Effect of bias on thermally stimulated current (TSC) in irradiated MOS devicesIEEE Transactions on Nuclear Science, 1991
- dc Electrical Degradation of Perovskite‐Type Titanates: III, A Model of the MechanismJournal of the American Ceramic Society, 1990
- Ferroelectric MemoriesScience, 1989
- Internal bias in ferroelectric ceramics: Origin and time dependenceFerroelectrics, 1988
- Review of literature on aging of dielectricsFerroelectrics, 1988