ESD Phenomena and Protection Issues in CMOS Output Buffers

• 1 April 1987
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 174-180
• https://doi.org/10.1109/irps.1987.362175

Abstract

Keywords

• ESD PHENOMENA
• OUTPUT BUFFERS
• CMOS OUTPUT
• PROTECTION ISSUES
• PHENOMENA AND PROTECTION