Atomic force microscopy of liquid-covered surfaces: Atomic resolution images
- 17 August 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 51 (7) , 484-486
- https://doi.org/10.1063/1.98374
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Semiconductor topography in aqueous environments: Tunneling microscopy of chemomechanically polished (001) GaAsApplied Physics Letters, 1987
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Scanning tunneling microscopyJournal of Applied Physics, 1987
- Experimental Observation of Forces Acting during Scanning Tunneling MicroscopyPhysical Review Letters, 1986
- Single-tube three-dimensional scanner for scanning tunneling microscopyReview of Scientific Instruments, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface roughness measurements of low-scatter mirrors and roughness standardsApplied Optics, 1984
- Three-dimensional stylus profilometryWear, 1982
- Interaction between a He atom and a graphite surfaceSurface Science, 1980
- The Topografiner: An Instrument for Measuring Surface MicrotopographyReview of Scientific Instruments, 1972