Surface carrier generation including tunnel transitions

This publication has 4 references indexed in Scilit:

• Surface recombination in semiconductors
  Surface Science, 1968
• Effective mass and intrinsic concentration in silicon
  Solid-State Electronics, 1967
• The effects of oxide traps on the MOS capacitance
  IEEE Transactions on Electron Devices, 1965
• Statistics of the Recombinations of Holes and Electrons
  Physical Review B, 1952