Magnetic Domain Structures in CoCr Films Studied by Lorentz Microscopy
- 1 March 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (3A) , L130
- https://doi.org/10.1143/jjap.22.l130
Abstract
Magnetization distribution and behavior of magnetization in CoCr sputtered films of various thickness are studied by high-resolution Lorentz microscopy. The perpendicular component of magnetization increases with increasing film thickness, corresponding to the increase in the Q-value. The dominant mechanism of magnetization reversal changes from the domain wall displacement mode in the 200 Å thick film to the rotational mode in the 1000 Å thick film. In the 600 Å thick film, elongated domains with a kind of cross-tie walls are formed perpendicular to an AC demagnetizing field in the film plane.Keywords
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